Three-temperature manual test box for radio frequency chip

A radio frequency chip three-temperature manual test box disclosed by the present invention comprises a test thermal insulation assembly, one side of the test thermal insulation assembly is provided with a test temperature control assembly, the test thermal insulation assembly is connected with the test temperature control assembly through a high and low temperature resistant assembly, and the top of the test thermal insulation assembly is provided with an air inlet assembly. An exhaust assembly is arranged at the top of the test heat preservation assembly and located on one side of the air inlet assembly, an inlet and outlet assembly is arranged on the side portion of the test heat preservation assembly, a sealing assembly is arranged on the inlet and outlet assembly, and a test jig is arranged in the test heat preservation assembly. The three-temperature manual test box for the radio frequency chip has the beneficial effects that the three-temperature manual test box for the radio frequency chip is ingeniou