Method for manufacturing contact on silicon carbide substrate and silicon carbide semiconductor device
The present disclosure relates to a method for making a contact on a SiC substrate, wherein the method comprises: providing a crystalline SiC substrate; modifying the crystal structure in the surface region of the SiC substrate and thereby generating a carbon-rich SiC portion in the surface region;...
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creator | JOSHI RAJESH KUMAR JOHANNES GEORG LAVEN SCHULZ HANS-JUERGEN ROY SASHWATI KRASNOCHON DAVID |
description | The present disclosure relates to a method for making a contact on a SiC substrate, wherein the method comprises: providing a crystalline SiC substrate; modifying the crystal structure in the surface region of the SiC substrate and thereby generating a carbon-rich SiC portion in the surface region; forming a contact layer on the SiC substrate by depositing a metallic contact material onto a surface region including the carbon-rich SiC portion; and thermally annealing at least a portion of the carbon-rich SiC portion of the SiC substrate and at least a portion of the contact layer, thereby generating a ternary metallic phase portion comprising at least the metallic contact material, silicon, and carbon. Still further, a SiC semiconductor device is described, comprising: a crystalline SiC substrate; and a contact layer including a ternary metallic phase portion in direct contact with the surface of the SiC substrate.
本公开涉及一种用于在SiC衬底上制造接触的方法,其中方法包括:提供晶体SiC衬底;对SiC衬底的表面区域中的晶体结构进行修改,并且由此在表面区域中生成富碳的SiC部分;通过将金属性接触材料沉 |
format | Patent |
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本公开涉及一种用于在SiC衬底上制造接触的方法,其中方法包括:提供晶体SiC衬底;对SiC衬底的表面区域中的晶体结构进行修改,并且由此在表面区域中生成富碳的SiC部分;通过将金属性接触材料沉</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240223&DB=EPODOC&CC=CN&NR=117594433A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25547,76298</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240223&DB=EPODOC&CC=CN&NR=117594433A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JOSHI RAJESH KUMAR</creatorcontrib><creatorcontrib>JOHANNES GEORG LAVEN</creatorcontrib><creatorcontrib>SCHULZ HANS-JUERGEN</creatorcontrib><creatorcontrib>ROY SASHWATI</creatorcontrib><creatorcontrib>KRASNOCHON DAVID</creatorcontrib><title>Method for manufacturing contact on silicon carbide substrate and silicon carbide semiconductor device</title><description>The present disclosure relates to a method for making a contact on a SiC substrate, wherein the method comprises: providing a crystalline SiC substrate; modifying the crystal structure in the surface region of the SiC substrate and thereby generating a carbon-rich SiC portion in the surface region; forming a contact layer on the SiC substrate by depositing a metallic contact material onto a surface region including the carbon-rich SiC portion; and thermally annealing at least a portion of the carbon-rich SiC portion of the SiC substrate and at least a portion of the contact layer, thereby generating a ternary metallic phase portion comprising at least the metallic contact material, silicon, and carbon. Still further, a SiC semiconductor device is described, comprising: a crystalline SiC substrate; and a contact layer including a ternary metallic phase portion in direct contact with the surface of the SiC substrate.
本公开涉及一种用于在SiC衬底上制造接触的方法,其中方法包括:提供晶体SiC衬底;对SiC衬底的表面区域中的晶体结构进行修改,并且由此在表面区域中生成富碳的SiC部分;通过将金属性接触材料沉</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNzDELwjAQBeAuDqL-h_MHOJRUxFGK4qKTe7leLjbQXkpy8fcbwc3F6fHxHm9ZuRvrECy4EGFCyQ5Jc_TyBAqiBRAEkh99IRDG3luGlPukEZUBxf62PH1sM2k5tfzyxOtq4XBMvPnmqtpezo_2uuM5dJxmJBbWrr3X9WF_bBpjTuafzRu7fkAx</recordid><startdate>20240223</startdate><enddate>20240223</enddate><creator>JOSHI RAJESH KUMAR</creator><creator>JOHANNES GEORG LAVEN</creator><creator>SCHULZ HANS-JUERGEN</creator><creator>ROY SASHWATI</creator><creator>KRASNOCHON DAVID</creator><scope>EVB</scope></search><sort><creationdate>20240223</creationdate><title>Method for manufacturing contact on silicon carbide substrate and silicon carbide semiconductor device</title><author>JOSHI RAJESH KUMAR ; JOHANNES GEORG LAVEN ; SCHULZ HANS-JUERGEN ; ROY SASHWATI ; KRASNOCHON DAVID</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN117594433A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>JOSHI RAJESH KUMAR</creatorcontrib><creatorcontrib>JOHANNES GEORG LAVEN</creatorcontrib><creatorcontrib>SCHULZ HANS-JUERGEN</creatorcontrib><creatorcontrib>ROY SASHWATI</creatorcontrib><creatorcontrib>KRASNOCHON DAVID</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JOSHI RAJESH KUMAR</au><au>JOHANNES GEORG LAVEN</au><au>SCHULZ HANS-JUERGEN</au><au>ROY SASHWATI</au><au>KRASNOCHON DAVID</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for manufacturing contact on silicon carbide substrate and silicon carbide semiconductor device</title><date>2024-02-23</date><risdate>2024</risdate><abstract>The present disclosure relates to a method for making a contact on a SiC substrate, wherein the method comprises: providing a crystalline SiC substrate; modifying the crystal structure in the surface region of the SiC substrate and thereby generating a carbon-rich SiC portion in the surface region; forming a contact layer on the SiC substrate by depositing a metallic contact material onto a surface region including the carbon-rich SiC portion; and thermally annealing at least a portion of the carbon-rich SiC portion of the SiC substrate and at least a portion of the contact layer, thereby generating a ternary metallic phase portion comprising at least the metallic contact material, silicon, and carbon. Still further, a SiC semiconductor device is described, comprising: a crystalline SiC substrate; and a contact layer including a ternary metallic phase portion in direct contact with the surface of the SiC substrate.
本公开涉及一种用于在SiC衬底上制造接触的方法,其中方法包括:提供晶体SiC衬底;对SiC衬底的表面区域中的晶体结构进行修改,并且由此在表面区域中生成富碳的SiC部分;通过将金属性接触材料沉</abstract><oa>free_for_read</oa></addata></record> |
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language | chi ; eng |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | Method for manufacturing contact on silicon carbide substrate and silicon carbide semiconductor device |
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