Testing device and method for measuring parallel influence of conventional cable on superconducting cable

The invention discloses a test device for measuring the parallel influence of a conventional cable on a superconducting cable. The test device at least comprises a superconducting cable sample cable device, a modularized parallel conventional conductor and a high-capacity direct-current power supply...

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Hauptverfasser: WU JIABIN, ZHOU BIBO, HU LIGUANG, WU YANZHI, LIU HAORAN, ZHAO WEILI, ZHANG QUAN, WANG LIANBING, XU XUHUI, XU PENG, CHEN CHUNLONG, LUO ZHIYI, CHEN TENGBIAO, CHEN XIAN, CHENG JIAN, HUANG YOUYI, JU ZHANGPING, ZHANG FENGYIN
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention discloses a test device for measuring the parallel influence of a conventional cable on a superconducting cable. The test device at least comprises a superconducting cable sample cable device, a modularized parallel conventional conductor and a high-capacity direct-current power supply. The superconducting cable sample cable device comprises a superconducting cable body and superconducting cable terminals at the two ends of the superconducting cable body, and the superconducting cable body is horizontally and straightly laid; the modularized parallel conventional conductor comprises a plurality of conventional conductor single modules, and the adjacent conventional conductor single modules are connected in series through a connector. The modularized parallel conventional conductors and the superconducting cable body are arranged in parallel and at the same height; and the high-capacity direct-current power supply is respectively connected with the superconducting cable sample cable device and th