Semiconductor automatic test equipment and test method

The invention relates to the technical field of semiconductor automatic testing, in particular to semiconductor automatic testing equipment and a testing method, and the semiconductor automatic testing equipment comprises semiconductor device testing equipment and control cabinets located at the two ends of the semiconductor device testing equipment, and a lifting adjusting mechanism is arranged on the semiconductor device testing equipment. The semiconductor device testing device comprises a lifting adjusting mechanism and an auxiliary opening and closing mechanism arranged perpendicular to the lifting adjusting mechanism, a semiconductor device grabbing mechanism is arranged on the lifting adjusting mechanism, a semiconductor device cleaning mechanism is arranged on the auxiliary opening and closing mechanism, and a testing plate is arranged in the semiconductor device testing device. According to the semiconductor device grabbing mechanism, the lifting adjusting mechanism can effectively change the rotatin