Multi-target test method based on high-speed small signal switching circuit

The invention relates to the field of high-speed small signal switching circuit testing, in particular to a multi-target testing method based on a high-speed small signal switching circuit, and the method comprises the steps: building a basic high-speed small signal switching circuit; dividing a gat...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: FU YULEI, FU TINGXI, LI WEI, CAO YAN'AO, LIU JINBO
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to the field of high-speed small signal switching circuit testing, in particular to a multi-target testing method based on a high-speed small signal switching circuit, and the method comprises the steps: building a basic high-speed small signal switching circuit; dividing a gating line by using the basic high-speed small signal switching circuit; a multi-target test result is obtained by using the gating circuit, and a plurality of parameter indexes are rapidly tested by adding different matching circuits in the gating circuit; when a power supply circuit and a counter are matched, a plurality of parameter indexes can be rapidly tested. When a signal amplification circuit and a frequency selection network are matched, the tuning fork product parameter testing device can be matched with a network analyzer to quickly test various parameter indexes of a plurality of tuning fork products. Accurate and stable measurement results are achieved, and the device can be practically matched with aut