Rapid non-uniformity correction device based on plane mirror and correction method thereof
The invention relates to the field of photoelectric measurement, in particular to a rapid non-uniformity correction device based on a plane mirror and a correction method thereof, and the method comprises the steps: S1, sequentially placing an infrared refrigeration type detector, a large-aperture i...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to the field of photoelectric measurement, in particular to a rapid non-uniformity correction device based on a plane mirror and a correction method thereof, and the method comprises the steps: S1, sequentially placing an infrared refrigeration type detector, a large-aperture infrared photoelectric imaging system and the plane mirror; s2, enabling the high-emissivity surface of the plane mirror to face the large-aperture infrared photoelectric imaging system, combining the high-emissivity surface with the environment temperature to serve as a high-temperature point, and collecting a high-temperature image through an infrared refrigeration type detector; s3, enabling the high-reflectivity surface of the plane mirror to face the large-aperture infrared photoelectric imaging system, combining the high-reflectivity surface with the cold diaphragm temperature reflected by the high-reflectivity surface as a low-temperature point, and collecting a low-temperature image through an infrared refri |
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