Analysis method and device for calculating shallow water nonlinear wave reflection coefficient and medium

One technical scheme of the invention provides an analysis method for calculating a shallow water nonlinear wave reflection coefficient. Another technical scheme of the invention is to provide an electronic device. Another technical scheme of the invention is to provide a computer readable storage m...

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Bibliographische Detailangaben
Hauptverfasser: WANG GUO, LIAN ZIXIANG, KONG YAOHUA, LIU JINGQIAO, SHAO HONGXIANG, GE JUNBO
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:One technical scheme of the invention provides an analysis method for calculating a shallow water nonlinear wave reflection coefficient. Another technical scheme of the invention is to provide an electronic device. Another technical scheme of the invention is to provide a computer readable storage medium. According to the invention, through wave surface information of two different measurement positions, and based on a Fourier series display form and Fourier transform of the elliptical cosine wave, a relationship among incident waves, reflected waves and measurement position wave surface information of the elliptical cosine wave is given, and then a reflection coefficient of the elliptical cosine wave can be obtained. According to the method, the influence of the slope effect can be considered, the slope effect is embedded into the relation of incident waves, reflected waves and measurement position wave surface information of the elliptic cosine waves through correction of the shallow water coefficient on th