Determining specular reflection information
A computer-implemented method (100) is described. The method includes receiving (102) first and second imaging data obtained by an imaging system (204) of an object (202), the object (202) illuminated by a first illumination (206a) in a first spectral band and a second illumination (206b) in a secon...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | A computer-implemented method (100) is described. The method includes receiving (102) first and second imaging data obtained by an imaging system (204) of an object (202), the object (202) illuminated by a first illumination (206a) in a first spectral band and a second illumination (206b) in a second spectral band, the second spectral band including spectral content different from the first spectral band. The second illumination incident on the object is polarized. The received first imaging data is obtained within a first spectral band. The received second imaging data is obtained within a second spectral band. The first illumination and the second illumination are permitted into the imaging system via an imaging system polarizer (310) of the imaging system according to polarization states of the reflected first illumination and the reflected second illumination received by the imaging system after reflection from the surface of the object. Information about specular reflections from the surface of the objec |
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