Array substrate mother board and test method of array substrate

The invention provides an array substrate mother board and a test method of an array substrate. The test circuit is arranged on the array substrate mother board, the same thin film transistors are replaced by the equivalent transistors, and the thin film transistors do not need to be tested in the a...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: BA JING, SUN HAOZHOU, ZHANG YONGGAN, ZHAO YINGCHUN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention provides an array substrate mother board and a test method of an array substrate. The test circuit is arranged on the array substrate mother board, the same thin film transistors are replaced by the equivalent transistors, and the thin film transistors do not need to be tested in the array substrate; the first electrodes of the plurality of equivalent transistors are connected to the first test terminal, the second electrodes of the plurality of equivalent transistors are connected to the second test terminal, the grid electrodes of the plurality of equivalent transistors are connected to the test transistors, and the plurality of test transistors are connected to the third test terminal, so that aging conditions can be applied to the plurality of equivalent transistors at the same time; the test efficiency is improved, the grid electrode of each equivalent transistor is connected to the fourth test terminal, the second electrode of the test transistor is connected to the grid electrode of the t