Chip surface defect detection method of compressed multi-head self-attention neural network

The invention belongs to the field of defect detection and image processing, and relates to a chip surface defect detection method based on a compressed multi-head self-attention neural network, which comprises the following steps of: photographing and collecting images on the surface of a chip by u...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	CHU JIE, TIAN XINRU, CAI JUEPING, WEN KAILIN, LI TIANHONG, KONG LIANG, ZHANG CHENGKAI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!