Measurement application device calibration unit, measurement system and method

The present disclosure provides a measurement application device calibration unit comprising at least one coupling element comprising a first connection and a second connection for coupling the coupling element into a signal measurement path coupled to a measurement application device, and a third c...

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Bibliographische Detailangaben
Hauptverfasser:	LAMIAN FRANCOIS, ROSE ALEX
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	The present disclosure provides a measurement application device calibration unit comprising at least one coupling element comprising a first connection and a second connection for coupling the coupling element into a signal measurement path coupled to a measurement application device, and a third connection for coupling the coupling element into a signal measurement path coupled to the measurement application device. Wherein the coupling element is configured as at least one of: coupling a signal out of the signal measurement path into the third connection and coupling a signal from the third connection into the signal measurement path, and a signal processing device coupled to the third connection of the coupling element, and the signal processing device is configured to receive a predetermined calibration signal when the coupling element couples the signal out of the signal measurement path to the third connection, and to generate a predetermined known calibration signal when the coupling element couples t