High-temperature material emissivity measuring system

The invention discloses a system for measuring the emissivity of a high-temperature material. The system comprises a micro spectrometer, a base, a black body empty box, a first high-temperature thermocouple wire and a thermocouple heating furnace controller, the black body empty box comprises two hemispheres, the two hemispheres are detachably and oppositely buckled to form a sphere, one hemisphere is fixed on the base, the top of the other hemisphere is provided with a jacket type sliding optical fiber interface, and the micro spectrometer is connected with the jacket type sliding optical fiber interface through an optical fiber line; the first high-temperature thermocouple wires are arranged between the first high-temperature thermocouple wires in pairs in a transverse, horizontal and opposite manner to form a storage bin, and the storage bin is used for storing and supporting a tested sample; the thermocouple heating furnace controller is arranged outside the black body empty box, is connected with the two