DC shunt metering error analysis processing method

The invention relates to the field of current error analysis and processing, in particular to a direct current shunt metering error analysis and processing method. The method comprises the following steps: acquiring a current metering value sequence of each operation cycle of each direct current shu...

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Bibliographische Detailangaben
Hauptverfasser:	ZHAO SHUAISHUAI, YAO QINGGANG, ZHAO YANCHEN, XUN GUANGYAN, YAN LONG, YAN MING, SHAN KE, CHEN ZI'AO, TIAN CHANGLI, WANG ZHONGGUI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The invention relates to the field of current error analysis and processing, in particular to a direct current shunt metering error analysis and processing method. The method comprises the following steps: acquiring a current metering value sequence of each operation cycle of each direct current shunt and an influence factor sequence of each type; according to the current metering value sequence of each direct current shunt in each operation period and the influence factor sequence of each type, obtaining a current metering value sequence of each direct current shunt in each operation period and a purification characteristic value of the influence factor sequence of each type; obtaining the stability of each type of influence factor according to the purification characteristic value; obtaining a real error value of each moment of each operation cycle of each direct current branch according to the stability of each type of influence factor; and obtaining a predicted error value of each direct current shunt at