MCU power-on self-test circuit, chip and electronic equipment

The invention relates to the field of chip design, and particularly discloses an MCU power-on self-test circuit, a chip and an electronic device.An MCU comprises a first LDO used for supplying power to a kernel, and the power-on self-test circuit comprises a first voltage detection circuit, a power-...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: CHEN GANG, CHEN SHIZHUO, ZHOU XIAOPENG, ZHANG MANRONG
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to the field of chip design, and particularly discloses an MCU power-on self-test circuit, a chip and an electronic device.An MCU comprises a first LDO used for supplying power to a kernel, and the power-on self-test circuit comprises a first voltage detection circuit, a power-on detection circuit, a request circuit, a delay restart circuit and a state controller; the first voltage detection circuit is respectively connected with the first LDO and the power-on detection circuit, the request circuit is respectively connected with the power-on detection circuit, the delay restart circuit and the state controller, and the state controller is respectively connected with the first LDO, the first voltage detection circuit, the power-on detection circuit and the delay restart circuit. Wherein the first voltage detection circuit and the power-on detection circuit are used for detecting whether the first LDO is powered on or not; the state controller controls the delay restart circuit and the req