HIL wire harness fault test device and test method

The invention discloses an HIL wire harness fault test device and test method, the device comprises a wire harness fault test unit and a wire harness fault acquisition circuit, the wire harness fault test unit comprises a controller, an IO output board card, a first IO acquisition board card, a seco...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SUN MENGQI, BI GUODONG, GUO ZEDE, ZONG JIANHUA
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses an HIL wire harness fault test device and test method, the device comprises a wire harness fault test unit and a wire harness fault acquisition circuit, the wire harness fault test unit comprises a controller, an IO output board card, a first IO acquisition board card, a second IO acquisition board card and a third IO acquisition board card; the wire harness fault acquisition circuit comprises a power switch and a relay, and the wire harness fault acquisition circuit is connected with the wire harness fault test unit and the to-be-tested HIL wire harness based on the power switch and the relay. And the controller determines whether the HIL connector has a fault according to the conduction condition of each power switch acquired by the first IO acquisition board card, and determines the fault type of the to-be-tested HIL wire harness according to the HIL connector port signal acquired by the second IO acquisition board card and the ECU connector conduction signal acquired by the third I