METHOD AND DEVICE FOR MEASURING A MEASUREMENT OBJECT

The invention relates to a method for measuring an object to be measured (1), in particular for determining the position and/or distance of the object to be measured (1), for example for measuring the width and/or flatness of the object to be measured (1), using a measuring system (2) that can be mo...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SCHWEIZER DANIEL, FULLMEIER, HERBERT, KIRSCHNER GERHARD
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to a method for measuring an object to be measured (1), in particular for determining the position and/or distance of the object to be measured (1), for example for measuring the width and/or flatness of the object to be measured (1), using a measuring system (2) that can be moved along a linear axis (7), the measuring system (2) having at least one sensor (4), a device (9) for detecting the position of a reference point (8) of the measuring system (2) is arranged, at least one measurement value of the measurement object (1) is detected using the sensor (4), and wherein a measurement error of the measurement value due to the inclination of the linear axis (7) by an inclination angle beta is determined, and wherein the measurement value is corrected to remove the measurement error. 一种用于使用可沿着线性轴(7)运动的测量系统(2)测量测量对象(1)的方法,特别是确定测量对象(1)的位置和/或距离,例如测量测量对象(1)的宽度和/或平坦度,其中所述测量系统(2)具有至少一个传感器(4),并且其中布置有用于检测所述测量系统(2)的参考点(8)的位置的装置(9),其中使用所述传感器(4)检测所述测量对象(1)的至少一个测量值,并且其中确定所述测量值的由于所述线性轴(7)倾斜了倾斜角β而引起的测量误差