Engineering measurement method and engineering target to be measured
The invention provides an engineering measurement method and a to-be-measured engineering target, and the method is used for measuring the spatial geometric parameters of a to-be-measured measurement point on the to-be-measured engineering target, and obtaining the spatial geometric parameters of a...
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| Hauptverfasser: | , , , , |
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| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
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| Zusammenfassung: | The invention provides an engineering measurement method and a to-be-measured engineering target, and the method is used for measuring the spatial geometric parameters of a to-be-measured measurement point on the to-be-measured engineering target, and obtaining the spatial geometric parameters of a plurality of condition measurement points. Establishing an overall geometric linear relationship based on the spatial geometric parameters of the plurality of condition measuring points; in addition, acquiring spatial geometric parameters of a plurality of verification measuring points different from the condition measuring points, and verifying the accuracy of the established overall geometric linear relationship based on the spatial geometric parameters of the plurality of verification measuring points; and obtaining the spatial geometric parameters of the to-be-measured point based on the verified overall geometric linear relationship. According to the method, the overall linear relation is calculated through th |
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