Full Stokes measuring instrument based on metasurface and correction method thereof

The invention discloses a metasurface-based full-Stokes measuring instrument and a correction method thereof, and relates to the technical field of optical devices, the metasurface-based full-Stokes measuring instrument is characterized in that the upper layer of a metasurface unit is arranged as a...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: PU SHIQI, XU JING, LIU SONGJIE, WANG XIYIN, ZHANG ZEJUN, SUN SHIXIAO
Format: Patent
Sprache:chi ; eng
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