Full Stokes measuring instrument based on metasurface and correction method thereof
The invention discloses a metasurface-based full-Stokes measuring instrument and a correction method thereof, and relates to the technical field of optical devices, the metasurface-based full-Stokes measuring instrument is characterized in that the upper layer of a metasurface unit is arranged as a...
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Format: | Patent |
Sprache: | chi ; eng |
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