Full Stokes measuring instrument based on metasurface and correction method thereof
The invention discloses a metasurface-based full-Stokes measuring instrument and a correction method thereof, and relates to the technical field of optical devices, the metasurface-based full-Stokes measuring instrument is characterized in that the upper layer of a metasurface unit is arranged as a...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a metasurface-based full-Stokes measuring instrument and a correction method thereof, and relates to the technical field of optical devices, the metasurface-based full-Stokes measuring instrument is characterized in that the upper layer of a metasurface unit is arranged as a GaN nano antenna column, the lower layer of the metasurface unit is an Al2O3 substrate, the metasurface unit comprises 20 * 40 * 3 unit lattices, and the metasurface unit is arranged in the middle of the metasurface unit; wherein the length, the width and the rotation angle theta of the nano antenna column in each unit lattice determine the phase displacement of transmission light; each sub-array performs polarization beam splitting and focusing on an incident light beam, and the light intensity of a polarization component is obtained on a focal plane; through combination of propagation phase modulation and geometric phase modulation, the metasurface is composed of three sub-arrays, each part can efficiently realiz |
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