Full Stokes measuring instrument based on metasurface and correction method thereof

The invention discloses a metasurface-based full-Stokes measuring instrument and a correction method thereof, and relates to the technical field of optical devices, the metasurface-based full-Stokes measuring instrument is characterized in that the upper layer of a metasurface unit is arranged as a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: PU SHIQI, XU JING, LIU SONGJIE, WANG XIYIN, ZHANG ZEJUN, SUN SHIXIAO
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The invention discloses a metasurface-based full-Stokes measuring instrument and a correction method thereof, and relates to the technical field of optical devices, the metasurface-based full-Stokes measuring instrument is characterized in that the upper layer of a metasurface unit is arranged as a GaN nano antenna column, the lower layer of the metasurface unit is an Al2O3 substrate, the metasurface unit comprises 20 * 40 * 3 unit lattices, and the metasurface unit is arranged in the middle of the metasurface unit; wherein the length, the width and the rotation angle theta of the nano antenna column in each unit lattice determine the phase displacement of transmission light; each sub-array performs polarization beam splitting and focusing on an incident light beam, and the light intensity of a polarization component is obtained on a focal plane; through combination of propagation phase modulation and geometric phase modulation, the metasurface is composed of three sub-arrays, each part can efficiently realiz