Electromigration testing device and method

The invention relates to an electromigration testing device and method. The electromigration testing device comprises a metal connector, a sample and an ampere meter. The back of the sample is connected with the metal connector, the front is electrically connected with the cathode of the power supply, and the metal connector is electrically connected with the anode of the power supply. The electromigration testing device is placed in a high-temperature box, and voltage is applied at the same time, so that metal ions in the metal connector migrate under the combined action of potential and temperature, namely, the metal ions migrate from the back face of the sample to the front face of the sample. As the ammeter is connected in series in the circuit formed by connecting the metal connector, the sample, the positive electrode and the negative electrode, the ammeter can detect the leakage current, when the leakage current reaches a preset value, the sample is invalid, and the failure time is the electromigration