Semiconductor tester software design method based on component assembly

The invention provides a semiconductor tester software design method based on component assembly. Software functions are divided in a systematized and structured thinking mode, a host program is established, the host program is used as a component container, standard components are accessed to the h...

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Hauptverfasser: KANG HAOHAO, YANG JIANQUN, DANG KANGWEI, HU GUOFENG
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention provides a semiconductor tester software design method based on component assembly. Software functions are divided in a systematized and structured thinking mode, a host program is established, the host program is used as a component container, standard components are accessed to the host program through a standard interface, a universal interface is established, and non-standard functional modules are accessed. And an execution data interface is established, data is converted into driving operation on an execution component in a data driving mode, and analysis execution is performed by a test execution unit. Visual test design or scripted test design is created according to actual needs, and a general test template is provided, so that test design links are simplified, and test analysis and evaluation functions are enhanced. Through the design method, coupling between functional parts can be reduced, reuse of standard parts can be enhanced, design can be simplified, software development efficie