Chip temperature testing method and system

The invention relates to the technical field of data mining, in particular to a chip temperature testing method and system. The method comprises the following steps: acquiring and analyzing a chip test thermal imaging image set to obtain a chip test thermal imaging heat energy image set; processing the chip test thermal imaging heat energy image set and constructing a model; temperature test chip data are obtained and extracted, temperature test chip structure data are obtained, the temperature test chip structure data are calculated, and predicted temperature data of a temperature test chip are obtained; converting the data of the temperature test chip to obtain a thermal imaging image of the temperature test chip; analyzing the thermal imaging image of the temperature test chip to obtain a first temperature of the test chip; analyzing the thermal imaging image of the temperature test chip to obtain a second temperature of the test chip; and calculating the first temperature of the test chip and the second t