Compound semiconductor device and manufacturing method thereof

The invention discloses a compound semiconductor device and a manufacturing method thereof. The compound semiconductor device comprises a substrate; the channel layer is located on the substrate; the barrier layer is located on the channel layer; the passivation layer is located on the barrier layer...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: QIU CHONGYI, CAI FUYU, LIN DAJUN, CAI BINXIANG
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a compound semiconductor device and a manufacturing method thereof. The compound semiconductor device comprises a substrate; the channel layer is located on the substrate; the barrier layer is located on the channel layer; the passivation layer is located on the barrier layer; the contact region is recessed in the passivation layer and the barrier layer, and a part of the channel layer is exposed at the bottom of the contact region; the double-layer silicide film is positioned on the contact region; and a copper contact on the bi-layer silicide film. 本发明公开一种化合物半导体器件及其制作方法,其中该化合物半导体器件包含:基底;沟道层,位于所述基底上;阻障层,位于所述沟道层上;钝化层,位于所述阻障层上;接触区,凹入所述钝化层和所述阻障层中,其中,部分的所述沟道层被暴露在所述接触区的底部;双层硅化物膜,位于所述接触区上;以及铜接触,位于所述双层硅化物膜上。