MCU (Microprogrammed Control Unit) on-chip ADC (Analog to Digital Converter) test method based on ST2500 test machine

The invention relates to an ST2500 test machine-based MCU (Microprogrammed Control Unit) on-chip ADC (Analog to Digital Converter) test method, which comprises the following steps of: (1) burning through a JTAG (Joint Test Action Group) interface program of an MCU to enable an on-chip ADC of the MCU...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	JI HANYING, DENG JIE, YUAN JUN, WANG ZHIPENG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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