MCU (Microprogrammed Control Unit) on-chip ADC (Analog to Digital Converter) test method based on ST2500 test machine

The invention relates to an ST2500 test machine-based MCU (Microprogrammed Control Unit) on-chip ADC (Analog to Digital Converter) test method, which comprises the following steps of: (1) burning through a JTAG (Joint Test Action Group) interface program of an MCU to enable an on-chip ADC of the MCU to be in a working state; (2) an ST2500 testing machine is configured, so that the testing machine can send out sinusoidal signals with specific frequency and amplitude according to needs; and (3) connecting an input pin of an ADC (Analog to Digital Converter) on an MCU (Microprogrammed Control Unit) chip with a pin of a tester for sending out a sinusoidal signal. And (4) running the test machine and the MCU program, and reading the ADC conversion result on the MCU chip. And (5) processing the data to complete testing of dynamic parameters and static parameters of the ADC on the MCU chip, and judging whether the ADC on the MCU chip is qualified or not. According to the invention, the accuracy of on-chip ADC testin