Method for measuring reflection coefficient based on polarized light

The invention discloses a method for measuring a complex refractive index based on a polarized light reflection coefficient, a measuring device is constructed, the measuring device comprises a display screen, an arithmetic unit and at least three groups of laser transceiving units, and each group of...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WU LING, WANG JIE, SU JIANGTAO, BAO YUZHE, WU WENBO
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a method for measuring a complex refractive index based on a polarized light reflection coefficient, a measuring device is constructed, the measuring device comprises a display screen, an arithmetic unit and at least three groups of laser transceiving units, and each group of laser transceiving unit comprises a laser generator, a polaroid and a photoelectric probe; a laser generator is turned on, light emitted by the laser generator is emitted to an object to be measured after passing through a polaroid, an angle theta between the light emitted by the laser generator and the object to be measured is set according to a preset value, and the photoelectric probe in each group of laser receiving and transmitting units is used for transmitting the light to the object to be measured. Collecting the reflected light of the laser emitted by the laser generator in the corresponding group of laser transceiver unit through the object to be measured, and obtaining the light intensity I collected by