Wafer sorting system and wafer sorting method
The invention provides a wafer sorting system and a wafer sorting method. The system is provided with a conveying device, a grabbing device, a plurality of wafer storage boxes and a control device. The plurality of wafer storage boxes are divided into a good product area, a non-classified inferior p...
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creator | GONG SHENGXIANG LIAO WEIJIE TANG FENGCHENG CHEN ZHENGKAI LIN XIUWEI ZHAO XUANXUN HE GUOCHENG SONG BAICHEN |
description | The invention provides a wafer sorting system and a wafer sorting method. The system is provided with a conveying device, a grabbing device, a plurality of wafer storage boxes and a control device. The plurality of wafer storage boxes are divided into a good product area, a non-classified inferior product area and a classified inferior product area. The classified inferior product area is provided with a plurality of defect areas corresponding to a plurality of defect types respectively. And the system conveys the non-defective wafers to the non-defective area, records the defect types of the defective wafers and conveys the defective wafers to the non-classification defective area. The system also performs classification processing on the plurality of inferior wafers in the non-classification inferior product area, takes the inferior wafers, and conveys the inferior wafers to the corresponding defective area in the classified inferior product area based on the classification result. According to the inventio |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN117085955A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN117085955A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN117085955A3</originalsourceid><addsrcrecordid>eNrjZNANT0xLLVIozi8qycxLVyiuLC5JzVVIzEtRKEeRyE0tychP4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hobmBhamlqamjsbEqAEA02wqVQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Wafer sorting system and wafer sorting method</title><source>esp@cenet</source><creator>GONG SHENGXIANG ; LIAO WEIJIE ; TANG FENGCHENG ; CHEN ZHENGKAI ; LIN XIUWEI ; ZHAO XUANXUN ; HE GUOCHENG ; SONG BAICHEN</creator><creatorcontrib>GONG SHENGXIANG ; LIAO WEIJIE ; TANG FENGCHENG ; CHEN ZHENGKAI ; LIN XIUWEI ; ZHAO XUANXUN ; HE GUOCHENG ; SONG BAICHEN</creatorcontrib><description>The invention provides a wafer sorting system and a wafer sorting method. The system is provided with a conveying device, a grabbing device, a plurality of wafer storage boxes and a control device. The plurality of wafer storage boxes are divided into a good product area, a non-classified inferior product area and a classified inferior product area. The classified inferior product area is provided with a plurality of defect areas corresponding to a plurality of defect types respectively. And the system conveys the non-defective wafers to the non-defective area, records the defect types of the defective wafers and conveys the defective wafers to the non-classification defective area. The system also performs classification processing on the plurality of inferior wafers in the non-classification inferior product area, takes the inferior wafers, and conveys the inferior wafers to the corresponding defective area in the classified inferior product area based on the classification result. According to the inventio</description><language>chi ; eng</language><subject>PERFORMING OPERATIONS ; POSTAL SORTING ; SEPARATING SOLIDS FROM SOLIDS ; SORTING ; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING ; TRANSPORTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231121&DB=EPODOC&CC=CN&NR=117085955A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231121&DB=EPODOC&CC=CN&NR=117085955A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>GONG SHENGXIANG</creatorcontrib><creatorcontrib>LIAO WEIJIE</creatorcontrib><creatorcontrib>TANG FENGCHENG</creatorcontrib><creatorcontrib>CHEN ZHENGKAI</creatorcontrib><creatorcontrib>LIN XIUWEI</creatorcontrib><creatorcontrib>ZHAO XUANXUN</creatorcontrib><creatorcontrib>HE GUOCHENG</creatorcontrib><creatorcontrib>SONG BAICHEN</creatorcontrib><title>Wafer sorting system and wafer sorting method</title><description>The invention provides a wafer sorting system and a wafer sorting method. The system is provided with a conveying device, a grabbing device, a plurality of wafer storage boxes and a control device. The plurality of wafer storage boxes are divided into a good product area, a non-classified inferior product area and a classified inferior product area. The classified inferior product area is provided with a plurality of defect areas corresponding to a plurality of defect types respectively. And the system conveys the non-defective wafers to the non-defective area, records the defect types of the defective wafers and conveys the defective wafers to the non-classification defective area. The system also performs classification processing on the plurality of inferior wafers in the non-classification inferior product area, takes the inferior wafers, and conveys the inferior wafers to the corresponding defective area in the classified inferior product area based on the classification result. According to the inventio</description><subject>PERFORMING OPERATIONS</subject><subject>POSTAL SORTING</subject><subject>SEPARATING SOLIDS FROM SOLIDS</subject><subject>SORTING</subject><subject>SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNANT0xLLVIozi8qycxLVyiuLC5JzVVIzEtRKEeRyE0tychP4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hobmBhamlqamjsbEqAEA02wqVQ</recordid><startdate>20231121</startdate><enddate>20231121</enddate><creator>GONG SHENGXIANG</creator><creator>LIAO WEIJIE</creator><creator>TANG FENGCHENG</creator><creator>CHEN ZHENGKAI</creator><creator>LIN XIUWEI</creator><creator>ZHAO XUANXUN</creator><creator>HE GUOCHENG</creator><creator>SONG BAICHEN</creator><scope>EVB</scope></search><sort><creationdate>20231121</creationdate><title>Wafer sorting system and wafer sorting method</title><author>GONG SHENGXIANG ; LIAO WEIJIE ; TANG FENGCHENG ; CHEN ZHENGKAI ; LIN XIUWEI ; ZHAO XUANXUN ; HE GUOCHENG ; SONG BAICHEN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN117085955A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>PERFORMING OPERATIONS</topic><topic>POSTAL SORTING</topic><topic>SEPARATING SOLIDS FROM SOLIDS</topic><topic>SORTING</topic><topic>SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>GONG SHENGXIANG</creatorcontrib><creatorcontrib>LIAO WEIJIE</creatorcontrib><creatorcontrib>TANG FENGCHENG</creatorcontrib><creatorcontrib>CHEN ZHENGKAI</creatorcontrib><creatorcontrib>LIN XIUWEI</creatorcontrib><creatorcontrib>ZHAO XUANXUN</creatorcontrib><creatorcontrib>HE GUOCHENG</creatorcontrib><creatorcontrib>SONG BAICHEN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>GONG SHENGXIANG</au><au>LIAO WEIJIE</au><au>TANG FENGCHENG</au><au>CHEN ZHENGKAI</au><au>LIN XIUWEI</au><au>ZHAO XUANXUN</au><au>HE GUOCHENG</au><au>SONG BAICHEN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Wafer sorting system and wafer sorting method</title><date>2023-11-21</date><risdate>2023</risdate><abstract>The invention provides a wafer sorting system and a wafer sorting method. The system is provided with a conveying device, a grabbing device, a plurality of wafer storage boxes and a control device. The plurality of wafer storage boxes are divided into a good product area, a non-classified inferior product area and a classified inferior product area. The classified inferior product area is provided with a plurality of defect areas corresponding to a plurality of defect types respectively. And the system conveys the non-defective wafers to the non-defective area, records the defect types of the defective wafers and conveys the defective wafers to the non-classification defective area. The system also performs classification processing on the plurality of inferior wafers in the non-classification inferior product area, takes the inferior wafers, and conveys the inferior wafers to the corresponding defective area in the classified inferior product area based on the classification result. According to the inventio</abstract><oa>free_for_read</oa></addata></record> |
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subjects | PERFORMING OPERATIONS POSTAL SORTING SEPARATING SOLIDS FROM SOLIDS SORTING SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING TRANSPORTING |
title | Wafer sorting system and wafer sorting method |
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