Sequential reasoning-based testability incidence matrix division method and electronic equipment thereof

The invention discloses a testability incidence matrix division method based on sequential reasoning and electronic equipment. The method comprises the following steps of: selecting a target transverse test element which has no correlation with other transverse test elements from an original matrix; enabling the target transverse test element and the remaining longitudinal test elements to form a first small matrix, and removing a row vector corresponding to the target transverse test element from the original matrix; forming a target set by using the transverse test elements corresponding to the row vectors with correlation in the original matrix through sequential reasoning; combining row vectors corresponding to the target set to obtain a second small matrix; and taking the first small matrix and the second small matrix as an original matrix, segmenting and testing an incidence matrix. Therefore, the effects of improving the calculation speed and reducing the calculation time are achieved. 本发明公开了一种基于循序推理的测