METHOD FOR EXTENSION TESTING AND EXTENSION TESTING DEVICE

The invention provides a method for extension testing and an extension testing device, and belongs to the technical field of testing. The method for extension testing comprises the following steps: cutting a material to be tested to obtain a sample to be tested, the sample to be tested having a cutt...

Ausführliche Beschreibung

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Hauptverfasser: SUN LONGLI, WU KAI
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention provides a method for extension testing and an extension testing device, and belongs to the technical field of testing. The method for extension testing comprises the following steps: cutting a material to be tested to obtain a sample to be tested, the sample to be tested having a cutting edge; performing defect detection on the cut edge of the to-be-detected sample to determine whether the to-be-detected sample is taken as a target sample or not; and in response to determining that the to-be-tested sample is taken as the target sample, carrying out an extension test on the target sample. 本申请提供一种用于延展测试的方法及延展测试装置,属于测试技术领域。用于延展测试的方法包括:对待测材料进行裁切,以获得待测样品,所述待测样品具有裁切边;对所述待测样品的裁切边进行缺陷检测,以确定是否将所述待测样品作为目标样品;以及响应于确定将所述待测样品作为所述目标样品,对所述目标样品进行延展测试。