Residual stress measuring method and device, electronic equipment and storage medium

The invention provides a residual stress measuring method and device, electronic equipment and a storage medium. The residual stress measuring method comprises the steps of obtaining a target cutting surface of a component model and grid node information of the target cutting surface; according to t...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SHI SONGYI, QIN HAILONG, SUN ZHIMIN, BI ZHONGNAN, XIE JINLI, LI DONGFENG, ZHENG RENREN, XIE MINGZHAO
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS
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