Residual stress measuring method and device, electronic equipment and storage medium
The invention provides a residual stress measuring method and device, electronic equipment and a storage medium. The residual stress measuring method comprises the steps of obtaining a target cutting surface of a component model and grid node information of the target cutting surface; according to t...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a residual stress measuring method and device, electronic equipment and a storage medium. The residual stress measuring method comprises the steps of obtaining a target cutting surface of a component model and grid node information of the target cutting surface; according to the structural features of the component model, multiple grid node sets are determined, and each grid node set comprises at least one grid node on the target switching face; aiming at each grid node set, applying a unit load to grid nodes in the grid node set so as to obtain a stress basis function, a displacement basis function and a corresponding bearing reaction function of the target cutting surface; constructing a bearing reaction matrix and a deformation matrix according to the stress basis functions, the displacement basis functions and the corresponding bearing reaction functions corresponding to all the grid node sets; and according to the reaction matrix, the deformation matrix and the error parameter, a c |
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