Chip testing method and related device

The invention provides a chip testing method and a related device. The embodiment of the invention can be applied to the field of chips. The method comprises the following steps: firstly, acquiring M pieces of first interface information, N pieces of environment agent configuration information, a fi...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LIANG ANRUI, YAN JINGLIN, MA ZIFA
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
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