Chip testing method and related device

The invention provides a chip testing method and a related device. The embodiment of the invention can be applied to the field of chips. The method comprises the following steps: firstly, acquiring M pieces of first interface information, N pieces of environment agent configuration information, a first signal list having a first mapping relationship with the M pieces of first interface information, and an instance signal list having a second mapping relationship with the N pieces of environment agent configuration information; and then, mapping the M pieces of first interface information and the N pieces of environment agent configuration information according to the signals with the same attributes in the first signal list and the instance signal list, the first mapping relationship and the second mapping relationship, and generating a connection macro applied to the test environment. According to the embodiment of the invention, the language barrier between the chip test case and the test environment is bro