Product copper plating layer surface defect detection method and system
The invention discloses a product copper plating layer surface defect detection method and system, and belongs to the field of defect detection.The method comprises the steps that a to-be-tested copper plating welding wire is fed, and a wire feeding resistance change curve is obtained through fittin...
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| creator | LIU ZHENG LIU BO LIU LETONG CHEN WEICHANG |
| description | The invention discloses a product copper plating layer surface defect detection method and system, and belongs to the field of defect detection.The method comprises the steps that a to-be-tested copper plating welding wire is fed, and a wire feeding resistance change curve is obtained through fitting; calculating a comprehensive curve change angle, and obtaining defect scale information; setting a surface defect detection operator according to the defect scale information; the method comprises the following steps: constructing an electrical test result array at a plurality of positions on the surface of a copper-plated welding wire, dividing the electrical test result array by adopting a detection operator to obtain a plurality of local arrays, and judging to obtain a plurality of defect local arrays and a plurality of defect positions; collecting images of a plurality of defect positions and carrying out graying processing to obtain a defect point set; and generating a defect detection result of the surface |
| format | Patent |
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calculating a comprehensive curve change angle, and obtaining defect scale information; setting a surface defect detection operator according to the defect scale information; the method comprises the following steps: constructing an electrical test result array at a plurality of positions on the surface of a copper-plated welding wire, dividing the electrical test result array by adopting a detection operator to obtain a plurality of local arrays, and judging to obtain a plurality of defect local arrays and a plurality of defect positions; collecting images of a plurality of defect positions and carrying out graying processing to obtain a defect point set; and generating a defect detection result of the surface</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231103&DB=EPODOC&CC=CN&NR=116990229A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231103&DB=EPODOC&CC=CN&NR=116990229A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LIU ZHENG</creatorcontrib><creatorcontrib>LIU BO</creatorcontrib><creatorcontrib>LIU LETONG</creatorcontrib><creatorcontrib>CHEN WEICHANG</creatorcontrib><title>Product copper plating layer surface defect detection method and system</title><description>The invention discloses a product copper plating layer surface defect detection method and system, and belongs to the field of defect detection.The method comprises the steps that a to-be-tested copper plating welding wire is fed, and a wire feeding resistance change curve is obtained through fitting; 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| language | chi ; eng |
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| subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Product copper plating layer surface defect detection method and system |
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