Generation method and equipment of equipment test process and computer readable storage medium
The invention discloses a device test process generation method and device, and a computer readable storage medium. The device test process generation method comprises the following steps: obtaining configuration information of a to-be-tested device; according to the configuration information, deter...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a device test process generation method and device, and a computer readable storage medium. The device test process generation method comprises the following steps: obtaining configuration information of a to-be-tested device; according to the configuration information, determining to-be-tested elements included in the to-be-tested equipment and a test item corresponding to each to-be-tested element; determining a basic sequence corresponding to the test items based on the installation information of the to-be-tested element; and determining a test flow of the to-be-tested equipment according to the basic sequence and the test influence parameter of each to-be-tested element. Through the method, the most adaptive test process can be generated based on the to-be-tested elements contained in different types of to-be-tested equipment, some potential influence factors are eliminated, and the test precision and test efficiency of the equipment are improved.
本发明公开了一种设备测试流程的生成方法、设备及计算机可读存储介质, |
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