IC aging test method and device, equipment and storage medium

The invention relates to the technical field of integrated circuit testing, in particular to an IC aging test method, device and equipment and a storage medium, and aims to determine corresponding test parameters under different IC aging tests according to specification parameters of a to-be-tested IC chip so as to control the workload of the test and improve the test efficiency. Meanwhile, the to-be-tested IC chip is tested through multiple aging test models, so that the aging test precision is improved, the technical problem that the aging test precision of the integrated circuit chip is not high in the prior art is solved, and the design of the integrated circuit chip is positively influenced. 本发明涉及集成电路测试技术领域，尤其涉及一种IC老化测试方法、装置、设备及存储介质，本发明通过根据待测试IC芯片的规格参数确定不同IC老化测试下对应的测试参数，以便于控制测试的工作量，同时通过多种老化测试模型对待测试IC芯片进行测试，提高了老化测试的精度，避免了现有技术中集成电路芯片老化测试的精度不高的技术问题，对集成电路芯片的设计有正面影响。