Inspection chip and manufacturing method thereof

The present invention provides a test chip which significantly suppresses color development unevenness and can simply realize quantification without depending on the introduction amount of a test solution. The inspection chip is provided with a first layer on one surface side and a second layer on the other surface side, one of the first layer and the second layer has a liquid receiving part A, the first layer has at least a detection confirmation part B, and the second layer has a liquid receiving part C; the second layer has at least a liquid flow section D adjacent to the detection confirmation section B and a liquid flow path E connected to the liquid flow section D. When a liquid to be inspected is dropped into the liquid receiving section A, the liquid to be inspected flows in a predetermined order by capillary action and reaches the detection confirmation section B, and when the liquid to be inspected is dropped into the liquid receiving section A, the liquid to be inspected flows in the predetermined