Bare chip testing system and bare chip testing method thereof

The invention provides a bare chip test system and a test method thereof. The bare chip test method comprises the following steps: receiving a test sample with test data; performing logic judgment on the test sample to generate a test flag; determining an operation mode according to the test flag; reading test data in the test sample according to the operation mode; an access test is performed on a memory in the memory controller according to the test data to generate a test result. 本发明提供一种裸片测试系统及其测试方法。裸片测试方法包括：接收具有测试数据的测试样本；对测试样本进行逻辑判断以产生测试旗标；依据测试旗标决定操作模式；依据操作模式读取测试样本中的测试数据；依据测试数据对存储器控制器中的存储器进行存取测试以产生测试结果。