Design circuit test method and device, equipment and medium

The invention provides a design circuit testing method and device, equipment and a medium, and relates to the technical field of circuit testing, and the method comprises the steps: obtaining a to-be-tested file and a test case; the test case comprises circuit input data, and the test case is obtain...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: HE WEI, ZHENG CHUYU, TANG DAN, BAO YUNGANG
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention provides a design circuit testing method and device, equipment and a medium, and relates to the technical field of circuit testing, and the method comprises the steps: obtaining a to-be-tested file and a test case; the test case comprises circuit input data, and the test case is obtained by describing a test task of a design circuit through a Lua language; inputting the to-be-tested file into the test case, executing the to-be-tested file based on the circuit input data and the test task in the test case, and obtaining a simulation output result for the design circuit; and obtaining a test result of the design circuit according to the simulation output result. The test case described based on the Lua language is used for testing the design circuit of the to-be-tested file, so that the test efficiency of the design circuit is improved. 本申请提供了一种设计电路的测试方法、装置、设备及介质,涉及电路测试技术领域,包括:获取待测试文件及测试用例;测试用例包括电路输入数据,测试用例是通过Lua语言对设计电路的测试任务进行描述所得到的用例;将待测试文件输入测试用例,并基于测试用例中的电路输入数据和测试任务,执行待测试文件,获取针对设计电路的仿真输出结果;根据仿真输