Coating machine sample table control method and device and magnetron sputtering coating machine
The invention provides a film plating machine sample table control method and device and a magnetron sputtering film plating machine, and relates to the technical field of film plating machines, and the film plating machine sample table control method comprises the following steps: determining a cur...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a film plating machine sample table control method and device and a magnetron sputtering film plating machine, and relates to the technical field of film plating machines, and the film plating machine sample table control method comprises the following steps: determining a current film plating sample; obtaining a target material plating sequence and corresponding coating time of the current coating sample; determining a coating rotation process based on the target material coating sequence and the corresponding coating time; and a sample table is controlled to rotate according to the coating rotation process, and coating of the current coating sample is completed. According to the invention, full-automatic start-stop control of the sample table during sample coating can be realized.
本发明提供了镀膜机样品台控制方法、装置及磁控溅射镀膜机,涉及镀膜机技术领域,镀膜机样品台控制方法包括:确定当前镀膜样品;获取所述当前镀膜样品的镀靶材顺序和相应的镀膜时间;基于所述镀靶材顺序和相应的镀膜时间确定镀膜转动流程;控制样品台按照所述镀膜转动流程进行转动,完成所述当前镀膜样品的镀膜。本发明可实现样品镀膜时样品台的全自动启停控制。 |
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