Method for detecting defects of ultra-high voltage power switch equipment by adopting high-energy rays
The invention discloses a method for detecting defects of an ultra-high voltage power switch device by adopting high-energy rays. According to the method, the power switch device is subjected to nondestructive detection by adopting the high-energy rays with the energy of 0.4-10MeV. By adopting the m...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a method for detecting defects of an ultra-high voltage power switch device by adopting high-energy rays. According to the method, the power switch device is subjected to nondestructive detection by adopting the high-energy rays with the energy of 0.4-10MeV. By adopting the method, the defect detection efficiency is guaranteed, and the defect detectability and the environmental safety are guaranteed.
本发明公开了一种采用高能射线对超特高压电力开关设备检测缺陷的方法,该方法采用能量为0.4~10MeV的高能射线对电力开关设备进行无损检测。采用方法,有利于保障缺陷检测效率、保障缺陷检出性以及环境安全性。 |
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