Joint measurement method, device and system and storage medium
The invention discloses a combined measurement method, device and system and a storage medium. The method comprises the following steps: outputting a first driving control signal to control a line scanning lens and a light source device to scan a to-be-measured product to obtain multiple pieces of s...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a combined measurement method, device and system and a storage medium. The method comprises the following steps: outputting a first driving control signal to control a line scanning lens and a light source device to scan a to-be-measured product to obtain multiple pieces of scanning image information, splicing the multiple pieces of scanning image information to obtain global image information, selecting a measurement lens according to a current to-be-measured element, and if the line scanning lens is the measurement lens, determining that the line scanning lens is the measurement lens. If yes, measuring on the global image information according to the measurement parameters of the current to-be-measured element to obtain a first measurement result and displaying the first measurement result; if the current to-be-measured element is an area array lens, outputting a second driving control signal to control the area array lens and the light source device to measure the measurement parame |
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