Test system applied to decentralized control system processing cycle calculation

The invention provides a testing system applied to decentralized control system processing cycle calculation, and belongs to the technical field of decentralized control system processing testing. The technical problem to be solved is to provide improvement of a test system structure applied to dece...

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Bibliographische Detailangaben
Hauptverfasser:	SUN CHANGWEN, WANG RONG, WEN WU, BAI DONGHAI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING
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Beschreibung
Zusammenfassung:	The invention provides a testing system applied to decentralized control system processing cycle calculation, and belongs to the technical field of decentralized control system processing testing. The technical problem to be solved is to provide improvement of a test system structure applied to decentralized control system processing cycle calculation. According to the technical scheme, the output end of a test starting module is connected with the input end of a pulse generator module, and the output end of the pulse generator module is connected with the switching end of a switching module; the output end of the first set value module is connected with the first input end of the first switching module; the output end of the second set value module is connected with the second input end of the first switching module, and the output end of the second set value module is connected with the first input end of the second switching module at the same time; the output end of the test reset module is connected with