SiP device life test sampling optimization method based on multi-source data fusion

The invention discloses a SiP device life test sampling optimization method based on multi-source data fusion. The SiP device life test sampling optimization method comprises the following steps: step 1, equivalence of a SiP product test profile; 2, SiP product structure similarity evaluation is carried out; step 3, historical data fusion based on Monte Carlo simulation; 4, historical test data fusion based on the Bayes principle is carried out; 5, establishing a sampling scheme design model based on SiP product reliability; and 6, designing a sampling scheme. According to the method, based on a Bayes data fusion theory and an LTPD sampling theory, aiming at the problem that the batch of SiP products cannot support identification and quality consistency inspection requirement tests, structural similarity analysis and data fusion method research are carried out on the SiP products, and a sampling model based on SiP device reliability is established; and a sampling method suitable for the SiP device is formulat