Fatigue testing machine for semiconductor probe

The invention discloses a fatigue testing machine for a semiconductor probe, which comprises a case, the bottom of the case is provided with a lifting platform and a rack, the rack is provided with a material bearing platform and a material pressing mechanism in a liftable manner, the material pressing mechanism is located above the material bearing platform, the top of the case is provided with a driving mechanism, and the driving mechanism is located above the material bearing platform. And the driving end of the driving mechanism is in transmission fit with the pressing mechanism. The fatigue testing machine for the semiconductor probe solves the anti-fatigue test problem of the semiconductor test probe. 本发明公开了一种半导体探针用疲劳测试机，包括机箱，所述机箱的底部设置有升降台和机架，所述机架上可升降地设置有承料平台和压料机构，所述压料机构位于承料平台的上方，机箱的顶部设置有驱动机构，所述驱动机构的驱动端与所述压料机构传动配合。该半导体探针用疲劳测试机，解决了半导体测试探针的抗疲劳测试问题。