Enhanced impedance measurement using CTMU
A method and apparatus for measuring unknown impedance. The apparatus comprises a first input for receiving a first signal generated by a first portion of the sensor circuit, the first portion comprising an unknown impedance and a first known resistance, the unknown impedance varying based on a phen...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | A method and apparatus for measuring unknown impedance. The apparatus comprises a first input for receiving a first signal generated by a first portion of the sensor circuit, the first portion comprising an unknown impedance and a first known resistance, the unknown impedance varying based on a phenomenon to be measured by the sensor circuit. The apparatus also includes a second input for receiving a second signal generated by a second portion of the sensor circuit, the second portion of the sensor circuit including a known impedance and a second known resistance. And the apparatus includes control logic to determine a measurement of the sensor circuit based on a time difference in which the reference voltage is reached at each of the first input and the second input.
一种用于测量未知阻抗的方法和装置。该装置包括第一输入,该第一输入用于接收由传感器电路的第一部分生成的第一信号,该第一部分包括未知阻抗和第一已知电阻,该未知阻抗基于待由传感器电路测量的现象而变化。该装置还包括第二输入,该第二输入用于接收由传感器电路的第二部分生成的第二信号,该传感器电路的第二部分包括已知阻抗和第二已知电阻。并且该装置包括控制逻辑部件,该控制逻辑部件用于基于在第一输入和第二输入中的每一者达到参考电压的时间差来确定传感器电路的测量结果。 |
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