Measuring system

The invention provides a measurement system which measures the shape of an object with high precision. The measurement system includes: a frame line recognition unit that detects one or more frame lines indicating a straight line portion from a captured image; a depth measurement unit that performs...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: TAKAHASHI SHUNJI, TANABE SATOMI, SHIMIZU NAOKI, YANG MENGLONG
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The invention provides a measurement system which measures the shape of an object with high precision. The measurement system includes: a frame line recognition unit that detects one or more frame lines indicating a straight line portion from a captured image; a depth measurement unit that performs depth measurement; and a size estimation unit that calculates the length of the frame line on the basis of the captured image and the result of the depth measurement. The measurement system may also have a function of specifying, from the captured image, a range in which the object to be measured is present. 本发明提供一种测量系统,其高精度地测量物体的形状。测量系统包括:框线识别部,其从拍摄图像中检测出表示直线部分的1个以上的框线;深度测量部,其执行深度测量;和尺寸推算部,其基于拍摄图像和深度测量的结果,计算框线的长度。测量系统也可以具有从拍摄图像中确定出测量对象物所存在于的范围的功能。