Automatic test device with fiber optic connection to remote server
An exemplary test system includes a test head and a device interface board (DIB) configured to connect to the test head. The DIB is used to hold a device under test (DUT). The DIB includes an electrical conductor for transmitting electrical signals between the DUT and the test head. The server is pr...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | An exemplary test system includes a test head and a device interface board (DIB) configured to connect to the test head. The DIB is used to hold a device under test (DUT). The DIB includes an electrical conductor for transmitting electrical signals between the DUT and the test head. The server is programmed to act as a test instrument. The server is external to and remote from the test head and is configured to communicate signals with the test head over a fiber optic cable. The signal includes a serial signal.
本发明公开了一种示例性测试系统,其包括测试头和装置接口板(DIB),该装置接口板被配置以连接至该测试头。该DIB用于固持受测装置(DUT)。该DIB包括用于在该DUT与该测试头之间传输电信号的电导体。服务器经编程以作为测试仪器。该服务器是在该测试头外部且远离该测试头,并被配置以通过光纤缆线与该测试头传递信号。该信号包括串行信号。 |
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