Memory test system and test method

The invention provides a memory test system and method, the memory test system comprises a vector generator, a test board and a memory tester, the vector generator is used for generating at least one test vector and sending the test vector to the test board, and the test board is used for receiving the test vector and sending the test vector to the memory tester; and the memory tester is used for executing the test vector so as to correspondingly test the memory to be tested. Namely, the vector generator and the memory tester are linked through the test board, so that the depth and the line number of the generated test vector can be increased, the test vector required by the memory to be tested is generated, and the test requirement of the memory to be tested is met. 本发明提供一种存储器测试系统及测试方法，存储器测试系统包括向量发生器、测试板和存储器测试仪，向量发生器用于生成至少一个测试向量，并将测试向量发送至测试板，测试板用于接收测试向量，并将测试向量发送至存储器测试仪；存储器测试仪用于执行测试向量以对待测存储器进行相应的测试。即，向量发生器与存储器测试仪通过测试板来实现联动，由此可以增加所生成的测试向量的深度和行数，从而生成待测存储器所需的测试向量，进而满足待测存储器的测试需求。