Quality verification and optimization method for oblique photography model
The invention relates to the technical field of oblique photography model optimization, and particularly discloses an oblique photography model quality verification and optimization method, which is a standard method for evaluating and optimizing the quality of an oblique photography model. Extracti...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to the technical field of oblique photography model optimization, and particularly discloses an oblique photography model quality verification and optimization method, which is a standard method for evaluating and optimizing the quality of an oblique photography model. Extracting surveying and mapping vector data from the oblique photography model by amplitude, extracting a plurality of triangular facets from each piece of surveying and mapping vector data, and performing defect detection on the triangular facets according to a set rule to obtain the incomplete ratio of the triangular facets in each piece of surveying and mapping vector data so as to evaluate the quality of the oblique photography model; and marking the triangular surface with defects, inputting the marked triangular surface into a neural network model for iterative training to obtain a repair model of the triangular surface, and reconstructing the original triangular network for the defect part of each triangular surfac |
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